TEM/STEM Preparation

Advances in material complexity and shrinking feature dimensions have necessitated a scale of analysis only afforded by STEM and TEM. Sample preparation for this demanding type of analysis has become a bottleneck and existing solutions have fallen short of facilitating the evolving requirements of high resolution and high contrast imaging and analysis with negligible artifacts and improved productivity.

SELA’s Xact product family overcomes these limitations by applying its ground-breaking Adaptive Ion Milling (AIM) technology.

The innovative Adaptive Ion Milling technology (AIM™) delivers wide-area, ultra-thin, artifact-free specimens with high throughput and precise end-point detection.