MC600i is a fifth generation version of the award-wining Nano Cleaving series of the sample preparation systems for cross-section of crystalline materials for following SEM inspection and other analyses.

The MC600i system utilizes Nano Cleaving and Micro Cleaving technologies in two main processes – full process and fast process.

SELA’s Nano Cleaving and Micro Cleaving technologies are proved themselves as undisputed leaders for accurate, fast and artifact-free sample preparation. The MC600i system achieves fully automatic, reliable and rapid cross sectioning of wafer segments and dies. Dedicated software enables automatic mapping and navigating to targets, automatic off-loading for immediate inspection. High and consistent accuracy and excellent quality of cross-sections significantly reduce diagnostic cycle for failure analysis, characterization and process monitoring.

These features together with high throughput ensuring that sample preparation is never a bottleneck for SEM analysis.